[1]徐晓岭,王蓉华,顾蓓青.定时截尾串联系统屏蔽数据步进应力加速寿命试验的统计分析[J].江西师范大学学报(自然科学版),2015,(02):194-199.
 XU Xiaoling,WANG Ronghua,GU Beiqing.The Statistical Analysis of Mask Data for Type-I Censored Series System under Step-Stress Accelerated Life Test[J].,2015,(02):194-199.
点击复制

定时截尾串联系统屏蔽数据步进应力加速寿命试验的统计分析()
分享到:

《江西师范大学学报》(自然科学版)[ISSN:1006-6977/CN:61-1281/TN]

卷:
期数:
2015年02期
页码:
194-199
栏目:
出版日期:
2015-04-10

文章信息/Info

Title:
The Statistical Analysis of Mask Data for Type-I Censored Series System under Step-Stress Accelerated Life Test
作者:
徐晓岭;王蓉华;顾蓓青
1.上海对外经贸大学商务信息学院,上海 201620; 2.上海师范大学数理学院,上海 200234
Author(s):
XU XiaolingWANG RonghuaGU Beiqing
关键词:
屏蔽数据 定时截尾 串联系统 极大似然估计 步加试验
Keywords:
masked data type-I censored series system maximum likelihood estimate step-stress accelerated test
分类号:
TB 114.3
文献标志码:
A
摘要:
考虑由2个具有常数失效率单元串联而成的系统进行步进应力加速寿命试验中,在定时截尾屏蔽数据场合下给出了参数的近似区间估计和极大似然估计,并通过数值算例验证方法的可行性.
Abstract:
Considering series system of two units with constant failure rate under step-stress accelerated life test,the maximum likelihood estimates and approximate interval estimates of parameters are given in type-I censored masked data situation.Besides,Monte-Carlo simulation examples illustrate the feasibility of the method.

参考文献/References:

[1] Usher J S,Hodgson T J.Maximum likelihood analysis of component reliability using masked system life-test data [J].IEEE Transactions on Reliability,1988,37(5):550-555.
[2] Doganaksoy N.Interval estimation from censored & mask-ed system-failure data [J].IEEE Transactions on Reliability,1991,40(3):280-286.
[3] Lin D K J,Usher J S,Guess F M.Exact maximum likelihood estimation using masked system data [J].IEEE Transactions on Reliability,1993,42(4):631-635.
[4] Reiser B,Guttman I,Lin Dennis K J,et al.Bayesian inference for masked system lifetime data [J].Appl Statist,1995,44(1):79-90
[5] Usher J S.Weibull Component reliability-prediction in the presence of masked data [J].IEEE Transactions on Reliability,1996,45(2):229-232.
[6] Lin D K J,Usher H S,Guess F M.Bayes estimation of component-reliability from masked system-life data [J].IEEE Transactions on Reliability,1996,45(2):233-237.
[7] Sarhan A M.Reliability estimations of components from masked system life data [J].Reliability Engineering and System Safety,2001,74(1):107-113.
[8] Sarhan A M.The Bayes procedure in exponential reliability family models using conjugate convex tent prior family [J].Reliability Engineering and System Safety,2001,71(1):97-102.
[9] Sarhan A M.Estimation of system components reliabilities using masked data [J].Applied Mathematics and Computation,2003,136(1):79-92.
[10] Sarhan A M,El-Bassiouny A H.Estimation of components reliability in a parallel system using masked system life data [J].Applied Mathematics and Computation,2003,138(1):61-75.
[11] Sarhan A M,El-Gohary A I.Estimations of parameters in Pareto reliability model in the presence of masked data [J].Reliability Engineering and System Safety,2003,82(1):75-83.
[12] Sarhan A M.Parameter estimations in linear failure rate model using masked data [J].Applied Mathematics and Computation,2004,151(1):233-249.
[13] Sarhan A M.Parameter estimations in a general hazard rate model using masked data [J].Applied Mathematics and Computation,2004,153(2):513-536.
[14] Sarhan A M.Bayes estimations for reliability measures in geometric distribution model using masked system life test data [J].Computational Statistics and Data Analysis,2008,52(4):821-1836.
[15] El-Gohary A.Bayesian estimation of the parameters in two non-independent component series system with dependent time failure rate [J].Applied Mathematics and Computation,2004,154(1):41-51.
[16] Mukhopadhyay C.Maximum likelihood analysis of masked series system lifetime data [J].J Statist Plann Inference,2006,136(3):803-838.
[17] Hutto D E,Mazzuchi T,Sarkani S.Analysis of reliability using masked system life data [J].International Journal of Quality & Reliability Management,2009,26(7):723-739.
[18] Fan Tsaihung,Wang Wanlun.Accelerated life tests for Weibull series systems with masked data [J].IEEE Transactions on Reliability,2011,60(3):557-569.
[19] Fan Tsaihung,Hsu Tsungming.Accelerated life tests of a series system with masked interval data under exponential lifetime distributions [J].IEEE Transactions on Reliability,2012,61(3):798-808.
[20] Lin D K J,Guess F M.System life data analysis with dependent knowledge on the exact cause of system failure [J].Microelectronics Reliability,1994,34(3):535-544.
[21] Sarhan A M,Guess F M,Usher J S.Estimations for reliability measures in geometric distribution model using dependent masked system life test data [J].IEEE Trans on Reliability,2007,56(2):312-320.
[22] Lin G I,Reiser D K,Usher B,et al.Dependent masking and system life data analysis,Bayesian inference for two-component systems [J].Lifetime Data Anal,1995(1):87-100.
[23] Kuo L,Yang T E.Bayesian reliability modeling for masked system lifetime data [J].Statist Probab Lett,2000,47(3):229-241.
[24] 张士峰,邓爱民.含有屏蔽寿命数据的贝叶斯可靠性分析 [J].战术导弹技术,2001,3:34-39.
[25] 姜红燕,张帼奋.失效率为指数函数的模型中使用屏蔽数据的参数估计 [J].浙江大学学报:理学版,2006,33(2):125-128.
[26] 顾昕,师义民.屏蔽数据下双参指数部件的可靠性估计 [J].科学技术与工程,2009,9(18):5316-5319.
[27] 张帆,师义民.基于屏蔽数据的航空电源系统可靠性分析 [J].航天控制,2009,27(4):96-100.
[28] 刘英,师义民.屏蔽数据下航天器电源系统的可靠性的统计分析 [J].航天控制,2010,28(2):70-74.
[29] 刘英,师义民,王婷婷.基于屏蔽数据的部件可靠性指标的贝叶斯估计 [J].数理统计与管理,2010,29(5):853-860.
[30] 刘英,师义民,王婷婷.含有屏蔽数据的串联统计中Burr XII部件可靠性指标的Bayes估计 [J].系统工程理论与实践,2010,30(4):689-694.
[31] 张萌,师义民,杨扬.屏蔽数据下BurrXⅡ三部件串联系统的可靠性估计 [J].系统工程与电子技术,2011,33(1):222-227.
[32] Hou Hualei,Jiang Yaowei,Shi Yimin.Parameter estimations in BurrXII model using masked data [J].Chin Quart J of Math,2011,26(2):251-255.
[33] 张萌,师义民,杨扬.屏蔽数据下并联系统广义指数部件的可靠性估计 [J].信息与控制,2011,40(4):483-496.
[34] 张萌,师义民.屏蔽数据下三部件串联系统部件可靠性的Bayes估计 [J].火力与指挥控制,2011,36(12):24-30.
[35] 张萌,师义民,杨扬.含有屏蔽数据的截尾样本下部件的可靠性分析 [J].工程数学学报,2012,29(4):625-632.
[36] 张萌,陆山,杨杨.截尾情形下基于屏蔽数据的部件可靠性分析 [J].系统工程学报,2012,27(1):137-144.
[37] 顾昕,师义民,谭伟.屏蔽数据在新型截尾样本下系统的可靠性分析 [J].火力与指挥控制,2012,37(15):97-101.
[38] 张萌,陆山,杨杨.基于屏蔽数据多重定数截尾下系统部件的可靠性估计 [J].系统工程与电子技术,2013,35(5):1122-1127.
[39] Xu Ancha,Tang Yincai,Bayesian analysis of Pareto reliability with dependent masked data [J].IEEE Transactions on Reliability,2009,58(4):583-588.
[40] Wang Ronghua,Xu Xiaoling,Gu Beiqing.The statistical analysis of parallel system for type-I censored test using masked data[C]∥Recent Advance in Statistics Application and Related Areas-2nd Conference of the International Institute of Applied Statistics Studies,Qingdao,2009:789-795.
[41] 徐晓岭,顾蓓青,王蓉华,等.二元几何分布串联系统在屏蔽数据场合的参数估计 [J].西南交通大学学报,2012,47:91-94.
[42] Xu Ancha,Tang Yincai.An overview on statistical analysis for masked system lifetime data [J].Chinese Journal of Applied Probability and Statistics,2012,28(4):380-388.
[43] 杨剑锋,赵明.屏蔽数据下软件可靠性的极大似然估计 [J].系统工程与电子技术,2013,35(12):2665-2669.
[44] 师义民,顾昕,孙天宇,等.相依屏蔽数据下双参数指数部件的可靠性分析 [J].西北工业大学学报,2013,31(1):29-33.
[45] Nelson W.Accelerated life testing step-stress models and data analysis [J].IEEE Trans On Reliability,1980,29(2):103-108.
[46] Lawless J F.Statistical models and methods for lifetime data [M].New York:John Wiley and Sons Inc,1982.

备注/Memo

备注/Memo:
2013年度全国统计科学研究计划重点(2013LZ08);上海市教育委员会科研创新重点课题(14ZZ155);上海师范大学校级课题(SK201306)
更新日期/Last Update: 1900-01-01